Description: Optical inspection system for PCIs assembled with SMD, BGA and PTH components.
Fabrication Year: 2012
Mechanical Profilometer - Dektak XT
Description: Stylus-type profiler that enables repeatability of 4Å to perform the critical nanometer-level film, step and surface measurements needed in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials sciences.
Fabrication Year: 2010
X-ray inspection equipment PACE XR 2000
Description: Inspection System for the quality control and process verification of all aspects of microelectronics manufacturing. It
provides rapid, real-time x-ray inspection for production and rework environments for numerous applications, including multi-layer PCBs, small hole drilling, large back-planes and assemblies with advanced components, such as BGAs and chip-scale packages.
