Inspection optical microscope up to 8 "Nikon model L200
Description: Optical microscope for 200mm wafer and mask inspection capabilities for reflected light illumination defect identification with various observation methods such as brightfield, darkfield, simple polarizing and DIC.
Fabrication Year: 1992
Centro de Tecnologia da Informação Renato Archer
Dom Pedro I Highway (SP-65), Km 143.6 - Amarais - Campinas, SP - CEP 13069-901