Characterization & Metrology

  • Inspection optical microscope up to 8 "Nikon model L200

      Researcher visualizing electronic circuit in the Nikon Eclipse L200 optical inspection microscope
      • Description: Optical microscope for 200mm wafer and mask inspection capabilities for reflected light illumination defect identification with various observation methods such as brightfield, darkfield, simple polarizing and DIC.
      • Fabrication Year: 1992