Characterization & Metrology

  • x-Ray fluorescence spectrometer(XRF) Fischer model XDV-SD

      • Description: X-ray fluorescence (XRF) is an analytical technique that can be used to determine the chemical composition of a wide variety of sample types, including solids, liquids, pastes and loose powders. X-ray fluorescence is also used to determine the thickness and composition of layers and coatings. The coating that XDV-SD model can analyze includes gold,palladium and any other precious metal that measures ≤0.1 μm. The unit operates based on the specifications of RoHS and WEEE standards. It is also ideal for gauging function coatings in the electronics and in the semi-conductor industries.
      • Ano de fabricação: 2010
  • 4-probe electrical measurement systems Jandell model 3000+ with RM3000 Test Unit

      • Description: Surface resistivity measurement system allows for measurements in the range of 1 mohm/sq at 5 x 10 + 8 ohms / sq with 0.3% precision in samples up to 12 ”x 12” x 6 ”. Test Unit includes control software for PC for data recording ( and conversion of measurements into ohms per square or ohms-cm.
      • Fabrication Year: 2018